Industry Session

Session 2C (Industry, AI-Driven Testing; Aug. 19, 14:50, Roman Hall):
1. Alex Yu (Synopsys Inc. USA). AI-Driven Test Cost Reduction

2. Pearl He (Gubo Technology, China). Integrate Test Data to Build a High-Quality Data Platform in Semiconductor Product Development Lifecycle

3. Yu Huang (Huawei & HiSilicon Technologies Co., Ltd, China). Trending Of DFT & Yield Learning  

Session 4C (Industry, DFT for Complex Designs and Test Data Management; Aug. 20, 08:30, Roman Hall):
1. Wu Yang (Siemens EDA, USA). DFT Technology Scalable From 2D to 3D 
2. Jinshan Yu (Phytium Information Technology Co., Ltd. China). The Quality Challenges and Response Strategies of Processors under Advanced Technologies 
3. Louis Liu, (Shanghai YiChip Electronic Technology Co., Ltd). On Applying Machine Learning to Effectively Generate Low Power Test Pattern Set