Regular Session

Session 1A (Regular, Testing and Optimization; Aug.19, 13:30, Milan Hall):

1.Wei-Shen Wang (National Taiwan University), Zhe-Jia Liang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar and Ying-Shiun Li. Thermal-Aware Test Frequency Optimization
2.Zhouyang Li (Key Laboratory of Trustworthy Distributed Computing and Service, Beijing, China), Pengfei Qiu, Xiaoyong Li, Yu Qing, Chunlu Wang, Dongsheng Wang, Xiao Zhang and Gang Qu. Astronomical Eye: Data Traces Can be Distinguished by Performance Monitoring Unit
3.Min Jin (Tsinghua University, China) and Dong Xiang. A Fast Method for Constructing Phase Shifters to Reduce Wiring Conflicts

Session 1B (Regular, Architecture and DSP Security; Aug.19, 13:30, Venice Hall): 

1.Yicheng Huang (Beihang University, China), Xueyan Wang, Tianao Dai, Jianlei Yang, Zhaojun Lu, Xiaotao Jia, Gang Qu and Weisheng Zhao.  LLP-ECCA: A Low-Latency and Programmable Framework for Elliptic Curve Cryptography Accelerators (Best Paper Candidate)
2.Senling Wang (Ehime University, Japan), Shaoqi Wei, Hisashi Okamoto, Tatsuya Nishikawa, Kai Hiroshi, Higami Yoshinobu, Hiroyuki Yotsuyanagi, Ruijun Ma, Tianming Ni, Hiroshi Takahashi and Xiaoqing Wen. Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs (Best Paper Candidate)
3.Zhengfeng Huang (Hefei University of Technology, China), Yankun Lin, Fansheng Zeng, Jingchang Bian, Zhao Yang, Yingchun Lu, Liang Yao, Huaguo Liang, Xiaoqing Wen and Tianming Ni. PFO PUF: A Lightweight Parallel Feed Obfuscation PUF Resistant to Machine Learning Attacks (Best Paper Candidate)

Session 1C (Regular, Fault-tolerance Techniques; Aug.19, 13:30, Roman Hall):
1.Xuehua Li (Anhui University, China), Jie Song, Qingyang Zhang, Yuting He, Zhengfeng Huang and Xiaoqing Wen. Multiple-Error Interceptive Voter Designs for Safety-Critical Applications 
2.Ta Tan (National University of Defense Technology, China), Xiaowen Chen, Chen Li and Jianzhuang Lu.  Load balancing-oriented fault-tolerant NoC design 
3.Fan Xia (Anhui University, China), Jing Zhang, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen and Aibin Yan. SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement

Session 2A (Regular, Soft Error Mitigation; Aug.19, 14:50, Milan Hall):
1.Zhen Shen (Anhui University, China), Qingyang Zhang, Zhengfeng Huang, Jie Cui and Xiaoqing Wen. CQCTL: A Cost-Optimized and Quadruple-Node-Upset Completely Tolerant Latch Design for Safety-Critical Applications 
2.Yihao Shi (National University of Defense Technology, China), Sheng Ma, Bo Wang, Shengbai Luo, Qingshan Xue and Xueyi Zhang. Understanding and Mitigating the Soft Error of Language-Image Models 
3.Jiajia Zhang (Anhui University, China), Zhenmin Li, Guangzhu Liu, Jie Cui, Zhengfeng Huang, Xiaoqing Wen and Aibin Yan.    ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery

Session 2B (Regular, Circuit Level Security and Applications; Aug.19, 14:50, Venice Hall):
1.Praveen Karmakar (Indian Institute of Technology Guwahati, India), Anmoldeep Singh, Kartik Sharma, Chandan Karfa and Sukanta Bhattacharjee. NoBALL: A Novel BDD-based Attack against Logic Locking 
2.Junjun Wang (Xidian University, China), Zhao Huang, Hongxu Gao, Jia Zhou and Quan Wang. Design of Ultra-High Throughput and Resource Efficiency TRNG Based on NAND-XOR and Feedback XOR Ring Oscillators 
3.Shangtong Zhang (Beihang University, China), Xueyan Wang, Weisheng Zhao and Yier Jin. Triangle Counting Acceleration via Content Addressable Memory-Integrated 3D-Stacked Memory

Session 3A (Regular, Functional Testing: Correctness or Safety?; Aug.19, 16:20, Milan Hall):

1.Timothy Dunlap  (University of Maryland, College Park) and Gang Qu. Enhancing Subthreshold Stuck-at Fault Testing with Polymorphic Gates (Invited paper)
2.David Keezer (Georgia Institute of Technology, USA), Dany Minier and Hongjie Li. Multi-Stage Jitter-Reduction and Frequency Multiplication for 54 GHz ATE Clocks
3.Xuan Zheng (University of Bristol, UK), Tim Blackmore, James Buckingham and Kerstin Eder. Detecting Stimuli with Novel Temporal Patterns to Accelerate Functional Coverage Closure 
4.Ming Jun Wang (Institute of Computing Technology,  Chinese Academy of Sciences, China; CASTEST; University of Chinese Academy of Sciences), Hui Wang, Jianan Mu, Zizhen Liu, Jun Gao, Jing Ye, Xiaowei Li and Huawei Li. Efficient Functional Safety Method for Gate-Level Fine-Grained Digital Circuits with ISO-26262

Session 3B (Regular, PUF Design and Applications; Aug.19, 16:20, Venice Hall):
1.Chengjie Wang (Ningbo University, China), Yuejun Zhang, Shengjie Fu and Lixun Wang. A Physical Unclonable Function Feature Extraction Technique for Oil Paintings Copyright Protection
2.Jingchang Bian (Hefei University of Technology, China), Zhengfeng Huang, Ruixiang Liu, Yankun Lin, Zhao Yang and Huaguo Liang. A RO Integrated LFSR Based Nonlinear Strong PUF with Intrinsic Modeling Attacks Resilience 
3.Yijing Peng (National University of Defense Technology, China), Ding Deng, Zhenyu Wang and Yang Guo. SC-PUF: Shuffled Chaotic-dual-PUF With High Machine Learning Attack Resilience 
4.Yijing Peng (National University of Defense Technology, China), Yang Zhang, Qijin Zhu, Yang Guo and Xiaowen Chen. ELSeM: An Efficient and Lightweight Security Mechanism for DSP

Session 4A (Regular, Reliability-oriented Design; Aug.20, 08:30, Milan Hall): 
1.Zhijian Peng (Guangdong University of Technology, China), Peng Liu, Lian Yao, Zhiqiang You, Bosheng Liu, Yang Yi and Jigang Wu. A Complementary Resistive Switch-Based Balanced Ternary Logic 
2.Zhong Zhiwei (Hunan University, China), You Zhiqiang and Liu Peng. A Dynamic Weight Quantization-Based Fault-tolerant Training Method for Ternary Memristive Neural Network 
3.Xiaohui Wei (Jilin University, China), Jiaguo Deng, Xiaonan Wang, Zongdian Li, Nan Jiang and Hengshan Yue. CraftRGP: A Comprehensive Reliability Analysis Framework Towards ReRAM-Based Graph Processing

Session 4B (Regular, New Advances in Hardware Trojan Detection; Aug.20, 08:30, Venice Hall):
1.Zhen Wang (ShangHai University of Electric Power, China), Dan Jiang, Jingru Li and Shuhang Zheng. Accurate Hardware Trojan Detection Technology based on Node Concealment Features 
2.Yichen Li (Huazhong Agricultural University, China), Wei Hu, Hao Su, Xuelin Zhang, Yizhi Zhao and Lingjuan Wu. Pinpointing Hardware Trojans Through Semantic Feature Extraction and Natural Language Processing 
3.Xing Hu (National University of Defense Technology, China), Yang Zhang, Zhenghao Li and Shaoqing Li. CA4TJ: Correlational Analysis for Always-On Information-Leakage Hardware Trojan Detecting

Session 5A (Regular, AI for Testing; Aug.20, 09:50, Milan Hall):
1.Zhiteng Chao (Institute of Computing Technology, Chinese Academy of Sciences, China; CASTEST), Qinluan Dai, Jiale Li, Zizhen Liu, Wenxing Li, Hongqin Lyu, Jing Ye, Huawei Li and Xiaowei Li. A Static Test Compaction Method Based on Graph Neural Network Assisted Fault Classification
2.Yang Zeng (Peking University Shenzhen Graduate School, China) and Xiaole Cui. A High Performance PODEM Algorithm with the Improved Backtrace Process
3.Jiamei Liao (CATARC Automotive inspection center (Wuhan) Co.,Ltd, China), Qiu Qin, Sihan Sun, Wenjian Jiao, Xumin Wang, Xu Wang, Lei Zhang, Wenyuan Zhang, Zhe Ji, Ningning Fang and Hu Wang. Research on Optimization of Automobile Product Inspection Based on Convolutional Neural Network

Session 5B (Regular, Accelerators for Emerging Security Protocols; Aug.20, 09:50, Venice Hall):
1.Xiaolong Cheng (Harbin Institute of Technology (Shenzhen) , China), Aijiao Cui and Yier Jin.  A Hardware Security Evaluation Platform on RISC-V SoC 
2.Wenpeng Zhao (Huazhong University of Science and Technology, China), Qidong Chen, Yijie Wang, Haichun Zhang, Zhaojun Lu and Gang Qu.  A Survey on FPGA-based Accelerators for CKKS 
3.Xiaolin Li (Institute of Computing Technology,  Chinese Academy of Sciences, China), Wei Yan, Hongwei Liu, Yong Zhang, Qinfen Hao, Yong Liu and Ninghui Sun.      MPC-PAT: A Pipeline Architecture for Beaver Triple Generation in Secure Multi-party Computation 

Session 6A (Regular, SRAM Robustness; Aug.20, 11:10, Milan Hall):
1.Na Bai (Anhui University, China), Weihao Zhao, Yaohua Xu and Yi Wang.  A Low-Energy Critical Charge-Enhanced SRAM for Aerospace Applications 
2.Shuo Cai (Changsha University of Science and Technology, China), Xinjie Liang, Yan Wen, Fei Yu and Lairong Yin.  A radiation-hardened 20T SRAM Cell with high reliability and low power consumption
3.Yang Chang (Anhui University, China), Jing Zhang, Guangzhu Liu, Jie Cui, Zhengfeng Huang, Tianming Ni and Xiaoqing Wen. SHRCO: Design of an SRAM with High Reliability and Cost Optimization for Safety-Critical Applications

Session 6B (Regular, Clocking and Diagnosis; Aug.20, 11:10, Venice Hall):
1.Jun-Tsung Wu (National Sun Yat-sen University, Taiwan), Hideyuki Ichihara, Tomoo Inoue and Tong-Yu Hsieh. On Accuracy Enhancement of No-Reference Error-Tolerability Testing for Images in Object Detection Applications Based on RGB Channel Characteristics 
2.Qi Zhao (Xi'an Jiaotong University, China), Huibin Tao, Zhiheng He and Ruining Feng. Advanced DFT Clock Control Architectures with Agile Development for Chisel-Based High Performance RISC-V Processors 
3.Liyang Lai (Shantou University, China), Zefan Lin and Qitao Wang.  Sideway Scan, Solving the Achilles’ Heel of Scan-based Diagnosis