Industry Session

Session 1D (Industry Session I; Aug.20, 13:00, Xuedou Hall):

1.Junna Zhong (Siemens EDA). Designing the Future of Electronic Design with AI

2.Alex Yu (Synopsys). Beyond Manufacturing Test: An End-to-End Deterministic ATPG-Based In-System Test Solution for Reliable AI, Data Center and Automotive SoCs

3. Fan Yang (Empyrean Technology). 3D IC DFT Challenges

4. Jiexing Luo (Gubo Technologies). AI Agent Reconstructs Post-Silicon Testing: Spec-Centric Closed-Loop Test Architecture

Session 2D (Industry Session II; Aug.20, 14:05, Xuedou Hall):

1.Terry Gong (ByteDance). From Silent Errors to Proactive Defense: SDC Practices in ByteDance Data Centers

2.Kevin Shu(Intel). SDE challenge and Reliable Computing in Data Center Processors

3.Penghui Liu(AccoTEST). WBG (SiC/GaN) Semiconductors: Test Challenges and Solutions for Future AIDC Applications

4. Industry Practice Sharing